Semiconductor test probe with high-cycle life and precision pointing accuracy for wafer and package testing

Semiconductor Test Probe

REECUFUTURE Semiconductor Test Probes (e.g., Model RS100HD06470GL1310) are precision-engineered solutions for high-density IC testing, featuring a minimum center spacing of 1.27mm (50mil) and a rated mechanical life of 100,000 cycles. Utilizing a dual-ended, dual-action design, both the TOP and Bottom Plungers are crafted from gold-plated beryllium copper or stainless steel, ensuring stable electrical contact performance across an operating temperature range of -45°C to +80°C. The probe offers a working travel of 4.3mm with selectable spring force options of 100g±20%, contact resistance below 100mΩ, and the capability to continuously handle 2A to 5A of current. The precision-machined, gold-plated phosphor copper barrel paired with a music wire spring, along with a pointing accuracy of ±0.08mm, delivers a reliable and repeatable electrical interface for semiconductor wafer testing, package testing, and high-density PCB validation.

  • 🔬 Ultra-High Cycle Life – Engineered for 100,000 test cycles with replaceable pin design, maximizing uptime in production environments.
  • 🌡️ Wide Temperature Stability – Reliable performance from -45°C to +80°C, suitable for thermal testing and harsh industrial conditions.
  • 🎯 High-Density Precision – Achieve ±0.08mm pointing accuracy for fine-pitch semiconductor and wafer-level applications.